Publications
SAFEXPLAIN: Safe and Explainable Critical Embedded Systems Based on AI
TYPE OF PUBLICATION
AUTHORS
Jaume Abella, Jon Perez, Cristofer Englund, Bahram Zonooz, Gabriele Giordana, Carlo Donzella,
Francisco J. Cazorla, Enrico Mezzetti, Isabel Serra, Axel Brando, Irune Agirre, Fernando Eizaguirre
Thanh Hai Bui, Elahe Arani, Fahad Sarfraz, Ajay Balasubramaniam, Ahmed Badar, Ilaria Bloise, Lorenzo Feruglio, Ilaria Cinelli, Davide Brighenti, Davide Cunial
PUBLISHER
Institute of Electrical and Electronics Engineers (IEEE)
YEAR OF PUBLICATION
2023
PLACE OF PUBLICATION
Antwerp
ISBN
979-8-3503-9624-9
ISSN
DOI
https://doi.org/10.23919/DATE56975.2023.10137128
CITACION
Abella Ferrer, J. [et al.]. SAFEXPLAIN: Safe and Explainable Critical Embedded Systems Based on AI. A: Design, Automation and Test in Europe Conference and Exhibition. "2023 Design, Automation & Test in Europe Conference & Exhibition (DATE): Antwerp, Belgium, 17-19 April 2023". Institute of Electrical and Electronics Engineers (IEEE), 2023, ISBN 979-8-3503-9624-9. DOI 10.23919/DATE56975.2023.10137128.
LINK TO THE REPOSITORY
https://upcommons.upc.edu/handle/2117/388672
LINK TO THE PUBLICATION
https://ieeexplore.ieee.org/abstract/document/10137128